Why AI-Accelerated Development Challenges Traditional Security Testing

He's not alone. AI coding assistants have compressed development timelines from months to days. But while development ...
Electronic Design

Tackling Next-Generation RF SOC Test

Developing an automated production test solution for current and next-generation complex RF SIP/SOC devices is an increasingly difficult task. Both the test program and the device interface board (DIB ...
EDN

System-level test’s expanding role in producing complex chips

System-level test (SLT), once used largely as a stopgap measure to catch issues missed by automated test equipment (ATE), has evolved into a necessary test insertion for high-performance processors, ...