Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
Semiconductor Engineering

Using Deep Learning ADC For Defect Classification For Automatic Defect Inspection

In traditional semiconductor packaging, manual defect review after automated optical inspection (AOI) is an arduous task for operators and engineers, involving review of both good and bad die. It is ...
SiliconIndia

Real-World Applications of AI in Software Testing

With the faster rate of software development today, AI in testing is transforming the organizational approach to software Quality Assurance (QA). Organizations are implementing Artificial Intelligence ...
EDN

Ipanema Technologies Reduces Defects by 85 Percent Across its Software Supply Chain with Coverity Development Testing

Ipanema Technologies' Autonomic Networking System delivers fully automated Application Visibility, Quality of Service and Control, WAN Optimization, and Dynamic WAN Selection over an enterprise's ...